Focusing Review

Concept of Surface Excess Amount and Applications for Native and Modified Surfaces

Kazue Tani

Department of Applied Chemistry and Biotechnology, Interdisciplinary Graduate School of Medicine and Engineering, University of Yamanashi, 4-37 Takeda-4, Kofu, Yamanashi 400-8510, Japan

Abstract:

For surface excess amount and calculating it from chromatographic retention data, some important equations were summarized and the approximations involved were described. Then the layer model was introduced and used to calculate the composition of the adsorbed phase and estimate the absolute adsorbed amount. The surface properties of unmodified and chemically modified silica were characterized by measuring their surface excess isotherm.

Keywords: surface excess amount, solvent disturbance peak, retention volume of the labeled components, the layer model

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